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AI-Powered Defect Detection Using Deep Learning Enhancing Industrial Automation with U-Net and YOLOv3

AI-Powered Defect Detection Using Deep Learning Enhancing Industrial Automation with U-Net and YOLOv3
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Author(s): Fumiya Yamaguchi Yagi (Sanyo-Onoda City University, Japan), Fusaomi Nagata (Sanyo-Onoda City University, Japan), Maki K. Habib (The American University in Cairo, Egypt)and Keigo Watanabe (Okayama University, Japan)
Copyright: 2026
Pages: 20
Source title: AI-Driven Smart Industrial Technologies
Source Author(s)/Editor(s): Maki K. Habib (The American University in Cairo, Egypt)
DOI: 10.4018/979-8-3693-7994-3.ch003

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Abstract

This chapter explores the application of deep learning models, specifically U-Net and YOLOv3, in detecting crack-type defects in industrial materials. The research addresses key challenges, such as the limited availability of defective data samples, the difficulty of distinguishing fine defect details, and the need for precise quantitative evaluations in automated inspection systems. The chapter introduces the significance of defect detection in the context of smart manufacturing and discusses the limitations of traditional manual inspection methods. U-Net, known for its superior pixel-level semantic segmentation capabilities, is utilized for detailed defect localization, while YOLOv3, a real-time object detection model, is optimized for fast detection but has trade-offs in precision, particularly for irregular defect shapes. Both models are trained on a custom dataset provided by a material manufacturer incorporating a novel augmentation method that enhances generalization and improves detection accuracy by expanding defective sample diversity.

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