The IRMA Community
Newsletters
Research IRM
Click a keyword to search titles using our InfoSci-OnDemand powered search:
|
Crystallite Size Broadening of Diffraction Line Profiles
Abstract
In this chapter, the X-ray peak profile broadening caused by the finite size of scattering crystallites is studied in detail. According to Bertaut’s theorem, the line profile with the indices hkl is determined by the length distribution of columns building up the scattering crystallites normal to the hkl reflecting planes. The column length distribution determined from line profiles can be converted into crystallite size distribution. The effect of median and variance of crystallite size distribution on the shape of line profiles is also discussed. The line shapes for different crystallite size distribution functions (e.g. lognormal and York distributions) are given. It is shown that for spherical crystallites the peak broadening does not depend on the indices of reflections. The dependence of line profiles on the indices hkl is presented for various anisotropic shapes of crystallites.
Related Content
Erfan Nouri, Alireza Kardan, Vahid Mottaghitalab.
© 2024.
33 pages.
|
Mudassar Shahzad, Noor-ul-Huda Altaf, Muhammad Ayyaz, Sehrish Maqsood, Tayyba Shoukat, Mumtaz Ali, Muhammad Yasin Naz, Shazia Shukrullah.
© 2024.
31 pages.
|
Erfan Nouri, Alireza Kardan, Vahid Mottaghitalab.
© 2024.
32 pages.
|
Davronjon Abduvokhidov, Zhitong Chen, Jamoliddin Razzokov.
© 2024.
16 pages.
|
Shahid Ali.
© 2024.
25 pages.
|
Aamir Shahzad, Rabia Waris, Muhammad Kashif, Alina Manzoor, Maogang He.
© 2024.
13 pages.
|
Soraya Trabelsi, Ezeddine Sediki.
© 2024.
23 pages.
|
|
|