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Study on Upgrading the Lifetime of Mechanical Systems in Transportation Utilizing a Quantum/Transported Life-Stress and Sample Size Model
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Author(s): Seongwoo Woo (Reliability Association of Korea, South Korea), Dennis L. O'Neal (Baylor University, USA), Yimer M. Hassen (Ethiopian Technical University, Ethiopia), Gezae M. Mebrahtu (Ethiopian Technical University, Ethiopia)and Hadush T. Alem (Ethiopian Technical University, Ethiopia)
Copyright: 2025
Pages: 22
Source title:
Harnessing AI for Control Engineering
Source Author(s)/Editor(s): Mohamed Arezki Mellal (M'Hamed Bougara University, Algeria)
DOI: 10.4018/979-8-3693-7812-0.ch015
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Abstract
To upgrade the life of mechanical product, parametric accelerated life testing (ALT) was conducted. It included: (1) BX life with ALT tactic, (2) examination of the fatigue load, (3) a performance of ALTs with changes, and (4) a judgement whether the product attained the desired BX lifetime. A stress model developed from the quantum level was formulated. A sample size producing reliability quantitative (RQ) statements was also proposed. To demonstrate this parametric ALT, refrigerator fatigue failures during rail transit were evaluated by applying the equivalent raised damage potential by the power spectral density. In the first ALT, for RQ statements (40 min), refrigerant tubes in the refrigerator and soldering in the inverter PCB mounted on rubber made of ethylene propylene diene monomer suffered fatigue due to an insufficient damping. The failure during the first ALT was similar to those found from the field. When the rubber mounts and tubes in the compressor were redesigned, there were no issues in the second ALT. The refrigerator achieved the desired B1 life during transport.
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