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Practical Applications of X-Ray Line Profile Analysis

Practical Applications of X-Ray Line Profile Analysis
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Copyright: 2014
Pages: 48
Source title: X-Ray Line Profile Analysis in Materials Science
Source Author(s)/Editor(s): Jenő Gubicza (Eötvös Loránd University, Hungary)
DOI: 10.4018/978-1-4666-5852-3.ch009

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Abstract

In the previous chapters, the theory and the main methods of diffraction peak profile analysis were presented. Additionally, the specialties in the measurement and the evaluation of line profiles in the cases of thin films and single crystals were discussed. In this chapter, some practical considerations are given in order to facilitate the evaluation of peak profiles and the interpretation of the results obtained by this method. For instance, the procedures for instrumental correction are overviewed. Additionally, how the prevailing dislocation slip systems and twin boundary types in hexagonal polycrystals can be determined from line profiles is shown. Besides the dislocation density, the vacancy concentration can also be obtained by the combination of electrical resistivity, calorimetric, and line profile measurements. The crystallite size and the twin boundary frequency determined by X-ray peak profile analysis are compared with the values obtained by the direct method of transmission electron microscopy. Furthermore, the limits of line profile analysis in the determination of crystallite size and defect densities are given. Finally, short overviews on the results obtained by peak profile analysis for metals, ceramics, and polymers are presented.

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