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Characterization Methods for Nanomaterials

Characterization Methods for Nanomaterials
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Author(s): Yogesh K. Kadam (Vanita Vishram Women's University, India), Kinjal D. Solanki (Vanita Vishram Women's University, India), Mihar S. Shaikh (Vanita Vishram Women's University, India), Ashwini M. Savle (Vanita Vishram Women's University, India), Naved I. Malek (Sardar Vallabhbhai National Institute of Technology, India)and Neelam Mishra (Sir P.T. Sarvajanik College of Science, India)
Copyright: 2025
Pages: 32
Source title: Exploring Nanomaterial Synthesis, Characterization, and Applications
Source Author(s)/Editor(s): Krishnaraj Ramaswamy (Dambi Dollo University, Ethiopia), N. Nagaprasad (ULTRA College of Engineering and Technology, India)and Shanmugam Ramaswamy (JSS College of Pharmacy, India)
DOI: 10.4018/979-8-3693-6326-3.ch002

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Abstract

The characterization of nanoparticles is a critical element in nanotechnology, allowing for the exploration and enhancement of their distinct properties for various uses. This chapter elaborates various methods utilized in nanoparticle characterization, emphasizing on the techniques such as electron microscopy (TEM, SEM, and AFM), scattering (DLS), diffraction (XRD), and spectroscopy (UV-Vis, FTIR). Microscopic methods (TEM and SEM) offer detailed information on morphology and size distribution while AFM provides nano scale surface topography. Spectroscopic methods provide insights into chemical composition and surface chemistry. By combining these techniques, a thorough understanding of nanoparticle properties is gained which is crucial for their successful application in fields like medicine, electronics, and environmental science. Each of these techniques offers unique advantages and insights into the properties, structures, and behaviours of materials and biological specimens, contributing to advancements in scientific understanding and technological innovation.

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