The IRMA Community
Newsletters
Research IRM
Click a keyword to search titles using our InfoSci-OnDemand powered search:
|
A New Technique to Determine the Complex Permittivity of Each Layer for a Bi-Layer Dielectric Material at Microwave Frequency
Abstract
A new technique is presented to determine the complex relative permittivity of each layer of a bi-layer dielectric material. The bi-layer material sample is loaded in a Ku-band rectangular waveguide and its two port S-parameters are measured as a function of frequency using a Network Analyzer. Also, by applying the mode matching technique, expressions for the S-parameters of the bi-layer dielectric material as a function of complex relative permittivity of each layer are developed. To estimate the complex permittivity of each layer for a bi-layer dielectric material, the square sums of errors between the measured and calculated S-parameters are minimized using a nonlinear optimization algorithm. The complex permittivity of each layer for a bi-layer dielectric material such as FR4-Teflon, FR4-Delrin and Delrin-Teflon are determined at the Ku-band frequencies, the average relative errors between the individual dielectric materials and those of each layer of bi-layer dielectric materials are calculated.
Related Content
|
Aditi Nag.
© 2025.
38 pages.
|
|
Kapil Sharma, Nikhil Singh.
© 2025.
26 pages.
|
|
Kapil Sharma, Rachna Kathuria.
© 2025.
14 pages.
|
|
Sorabh Gupta, Mitu Sehgal, Rashmi Makkar, Alla Poorna Chandra Reddy, Habib Khan.
© 2025.
34 pages.
|
|
Yogeshwar Prajapati, Krupali Gosai, Omprakash Suthar, Sushil Kumar Singh, Muhammad Talha Usman, Habib Khan.
© 2025.
24 pages.
|
|
Aditi Nag, Anurag Singh Rathore.
© 2025.
38 pages.
|
|
Vishal Jain, Archan Mitra.
© 2025.
24 pages.
|
|
|