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Machine Fault Diagnosis and Prognosis using Self-Organizing Map
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Author(s): Kesheng Wang (NTNU, Norway), Zhenyou Zhang (NTNU, Norway)and Yi Wang (University of Manchester, UK)
Copyright: 2014
Pages: 20
Source title:
Biologically-Inspired Techniques for Knowledge Discovery and Data Mining
Source Author(s)/Editor(s): Shafiq Alam (University of Auckland, New Zealand), Gillian Dobbie (University of Auckland, New Zealand), Yun Sing Koh (University of Auckland, New Zealand)and Saeed ur Rehman (Unitec Institute of Technology, New Zealand)
DOI: 10.4018/978-1-4666-6078-6.ch006
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Abstract
This chapter proposes a Self-Organizing Map (SOM) method for fault diagnosis and prognosis of manufacturing systems, machines, components, and processes. The aim of this work is to optimize the condition monitoring of the health of the system. With this method, manufacturing faults can be classified, and the degradations can be predicted very effectively and clearly. A good maintenance scheduling can then be created, and the number of corrective maintenance actions can be reduced. The results of the experiment show that the SOM method can be used to classify the fault and predict the degradation of machines, components, and processes effectively, clearly, and easily.
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