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A New Technique to Determine the Complex Permittivity of Each Layer for a Bi-Layer Dielectric Material at Microwave Frequency
Abstract
A new technique is presented to determine the complex relative permittivity of each layer of a bi-layer dielectric material. The bi-layer material sample is loaded in a Ku-band rectangular waveguide and its two port S-parameters are measured as a function of frequency using a Network Analyzer. Also, by applying the mode matching technique, expressions for the S-parameters of the bi-layer dielectric material as a function of complex relative permittivity of each layer are developed. To estimate the complex permittivity of each layer for a bi-layer dielectric material, the square sums of errors between the measured and calculated S-parameters are minimized using a nonlinear optimization algorithm. The complex permittivity of each layer for a bi-layer dielectric material such as FR4-Teflon, FR4-Delrin and Delrin-Teflon are determined at the Ku-band frequencies, the average relative errors between the individual dielectric materials and those of each layer of bi-layer dielectric materials are calculated.
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